Through a combination of conductive-tip atomic force microscopy (CAFM) and X-ray photemission electron microscopy (XPEEM), we have investigated the phase separation ocurring at the metal-insulator transition of NdNiO3 thin films. Our images reveal the nucleation of ∼100–300 nm metallic domains in the insulating state that grow and percolate as temperature increases. In our paper just out in Nano Letters, we discuss the resistance contrast mechanism, analyze the microscopy and transport data within a percolation model, and propose experiments to harness this mesoscopic electronic texture in devices.
This work was performed in collaboration with the Helmholtz-Zentrum Berlin and the Laboratoire de Physiques des Solides in Orsay.
Direct Mapping of Phase Separation across the Metal–Insulator Transition of NdNiO3
D. Preziosi et al ; Nano Lett. 10.1021/acs.nanolett.7b04728 (2018)