Stéphane is an Associate Professor at the Université of Evry Val d’Essonne. He is an expert of scanning probe microscopy techniques such as conductive AFM or piezoresponse force microscopy (PFM).
His main interests are in domains and domain walls in ferroelectric and multiferroic materials and in their dynamical properties.
Fusil was listed as a Highly Cited Researcher by Clarivate Analytics in 2018.
Phone : +33-1-6941-5842
Email : stephane.fusil [at] cnrs-thales.fr